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SN74BCT8374ANTG4 |
|
| Part Number | SN74BCT8374ANTG4 |
| Zouser Part # | SN74BCT8374ANTG4 |
| Manufacturer | Texas Instruments |
| Category | Semiconductors › Logic ICs › Specialty Logic |
| Description | IC SCAN TEST DEVICE W/FF 24-DIP |
| Lifecycle | Obsolete |
| RoHS | No RoHS Information |
| EDA/CAD Models | SN74BCT8374ANTG4 PCB Footprint and Symbol |
| Warehouses | USA, Europe, China, Hong Kong SAR |
| Estimated Delivery | Nov 26 - Dec 1 (Choose Expedited Shipping) |
| Warranty | Up to 1 year [Limited-Warranty]* |
Shipping
Payment
Quick Inquiry
| In Stock | 330 - More on Order |
|---|---|
| Quote Limit | No Limit |
| Lead-Time | To be Confirmed |
| Minimum | 1 |
Pricing (USD)
Price is not available, Please RFQ| Qty. | Unit Price | Ext. Price |
|---|---|---|
| 1 | $ 0.0000 | $ 0.0000 |
| 100 | $ 0.0000 | $ 0.0000 |
| 500 | $ 0.0000 | $ 0.0000 |
| 1000 | $ 0.0000 | $ 0.0000 |
Zouser will offer the most competitive prices for you, please refer to the quotations.
SN74BCT8374ANTG4 Specifications
| Part Number | SN74BCT8374ANTG4 | |
| Brand | Texas Instruments | |
| Lifecycle | Obsolete | |
| RoHS | No RoHS Information | |
| Product Line | Semiconductors | |
| Category | Logic ICs | |
| Subcategory | Specialty Logic | |
| Manufacturer | ||
| Series | 74BCT |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |
| Supply Voltage | 4.5V ~ 5.5V | |
| Number of Bits | 8 | |
| Operating Temperature | 0°C ~ 70°C | |
| Mounting Type | Through Hole | |
| Package / Case | 24-DIP (0.300", 7.62mm) | |
| Supplier Device Package | 24-PDIP |
SN74BCT8374ANTG4 Documents
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